The development of a goodness-of-fit test for high level binary multilevel models.
| dc.contributor.author | Fernando, G. | |
| dc.contributor.author | Sooriyarachchi, M.R. | |
| dc.date.accessioned | 2021-07-07T03:24:05Z | |
| dc.date.available | 2021-07-07T03:24:05Z | |
| dc.date.issued | 2020 | |
| dc.description.abstract | Before making inferences about a population using a fitted model, it is necessary to determine whether the fitted model describes the data well. A poorly fitted model may lead to biased and invalid conclusions, resulting in incorrect inferences. Recent studies show the necessity of goodness-of-fit tests for high level binary multilevel models. The focus here was to develop a goodness-of-fit test to use in the model adequacy testing of high level binary multilevel models and to examine, whether the type I error and power hold for the newly developed goodness-of-fit test considering a three-level random intercept model. | en_US |
| dc.description.sponsorship | No Sponsors | en_US |
| dc.identifier.citation | Gayara Fernando, Roshini Sooriyarachchi (2020). The development of a goodness-of-fit test for high level binary multilevel models. Communications in Statistics-Simulation and Computation. Published Online DOI: 10.1080/03610918.2019.1700275 | en_US |
| dc.identifier.uri | http://archive.cmb.ac.lk:8080/xmlui/handle/70130/5454 | |
| dc.language.iso | en | en_US |
| dc.publisher | Taylor and Francis | en_US |
| dc.subject | Goodness-of-fit test; Limited-information goodness- of-fit testing; High level models; Type I error; power; Simulation | en_US |
| dc.title | The development of a goodness-of-fit test for high level binary multilevel models. | en_US |
| dc.type | Article | en_US |
