The development of a goodness-of-fit test for high level binary multilevel models.

dc.contributor.authorFernando, G.
dc.contributor.authorSooriyarachchi, M.R.
dc.date.accessioned2021-07-07T03:24:05Z
dc.date.available2021-07-07T03:24:05Z
dc.date.issued2020
dc.description.abstractBefore making inferences about a population using a fitted model, it is necessary to determine whether the fitted model describes the data well. A poorly fitted model may lead to biased and invalid conclusions, resulting in incorrect inferences. Recent studies show the necessity of goodness-of-fit tests for high level binary multilevel models. The focus here was to develop a goodness-of-fit test to use in the model adequacy testing of high level binary multilevel models and to examine, whether the type I error and power hold for the newly developed goodness-of-fit test considering a three-level random intercept model.en_US
dc.description.sponsorshipNo Sponsorsen_US
dc.identifier.citationGayara Fernando, Roshini Sooriyarachchi (2020). The development of a goodness-of-fit test for high level binary multilevel models. Communications in Statistics-Simulation and Computation. Published Online DOI: 10.1080/03610918.2019.1700275en_US
dc.identifier.urihttp://archive.cmb.ac.lk:8080/xmlui/handle/70130/5454
dc.language.isoenen_US
dc.publisherTaylor and Francisen_US
dc.subjectGoodness-of-fit test; Limited-information goodness- of-fit testing; High level models; Type I error; power; Simulationen_US
dc.titleThe development of a goodness-of-fit test for high level binary multilevel models.en_US
dc.typeArticleen_US

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