The development of a goodness-of-fit test for high level binary multilevel models.
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Taylor and Francis
Abstract
Before making inferences about a population using a fitted model, it
is necessary to determine whether the fitted model describes the
data well. A poorly fitted model may lead to biased and invalid conclusions,
resulting in incorrect inferences. Recent studies show the
necessity of goodness-of-fit tests for high level binary multilevel
models. The focus here was to develop a goodness-of-fit test to use
in the model adequacy testing of high level binary multilevel models
and to examine, whether the type I error and power hold for the
newly developed goodness-of-fit test considering a three-level random
intercept model.
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Keywords
Goodness-of-fit test; Limited-information goodness- of-fit testing; High level models; Type I error; power; Simulation
Citation
Gayara Fernando, Roshini Sooriyarachchi (2020). The development of a goodness-of-fit test for high level binary multilevel models. Communications in Statistics-Simulation and Computation. Published Online DOI: 10.1080/03610918.2019.1700275
