dc.contributor.author |
Fernando, G. |
|
dc.contributor.author |
Sooriyarachchi, M.R. |
|
dc.date.accessioned |
2021-07-07T03:24:05Z |
|
dc.date.available |
2021-07-07T03:24:05Z |
|
dc.date.issued |
2020 |
|
dc.identifier.citation |
Gayara Fernando, Roshini Sooriyarachchi (2020). The development of a goodness-of-fit test for high level binary multilevel models. Communications in Statistics-Simulation and Computation. Published Online DOI: 10.1080/03610918.2019.1700275 |
en_US |
dc.identifier.uri |
http://archive.cmb.ac.lk:8080/xmlui/handle/70130/5454 |
|
dc.description.abstract |
Before making inferences about a population using a fitted model, it
is necessary to determine whether the fitted model describes the
data well. A poorly fitted model may lead to biased and invalid conclusions,
resulting in incorrect inferences. Recent studies show the
necessity of goodness-of-fit tests for high level binary multilevel
models. The focus here was to develop a goodness-of-fit test to use
in the model adequacy testing of high level binary multilevel models
and to examine, whether the type I error and power hold for the
newly developed goodness-of-fit test considering a three-level random
intercept model. |
en_US |
dc.description.sponsorship |
No Sponsors |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
Taylor and Francis |
en_US |
dc.subject |
Goodness-of-fit test; Limited-information goodness- of-fit testing; High level models; Type I error; power; Simulation |
en_US |
dc.title |
The development of a goodness-of-fit test for high level binary multilevel models. |
en_US |
dc.type |
Article |
en_US |