The development of a goodness-of-fit test for high level binary multilevel models.

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dc.contributor.author Fernando, G.
dc.contributor.author Sooriyarachchi, M.R.
dc.date.accessioned 2021-07-07T03:24:05Z
dc.date.available 2021-07-07T03:24:05Z
dc.date.issued 2020
dc.identifier.citation Gayara Fernando, Roshini Sooriyarachchi (2020). The development of a goodness-of-fit test for high level binary multilevel models. Communications in Statistics-Simulation and Computation. Published Online DOI: 10.1080/03610918.2019.1700275 en_US
dc.identifier.uri http://archive.cmb.ac.lk:8080/xmlui/handle/70130/5454
dc.description.abstract Before making inferences about a population using a fitted model, it is necessary to determine whether the fitted model describes the data well. A poorly fitted model may lead to biased and invalid conclusions, resulting in incorrect inferences. Recent studies show the necessity of goodness-of-fit tests for high level binary multilevel models. The focus here was to develop a goodness-of-fit test to use in the model adequacy testing of high level binary multilevel models and to examine, whether the type I error and power hold for the newly developed goodness-of-fit test considering a three-level random intercept model. en_US
dc.description.sponsorship No Sponsors en_US
dc.language.iso en en_US
dc.publisher Taylor and Francis en_US
dc.subject Goodness-of-fit test; Limited-information goodness- of-fit testing; High level models; Type I error; power; Simulation en_US
dc.title The development of a goodness-of-fit test for high level binary multilevel models. en_US
dc.type Article en_US


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