Abstract:
Low Density Polyethylene (LDPE) is one of the most important constituents of waste generated,
since the time taken for its natural degradation is long. Therefore, this study mainly focused on
identifying efficient fungal degraders of LDPE. Partially degraded polyethylene was collected
from different places in Kaduwela area, Sri Lanka to isolate the abundant fungi in degrading
polyethylene. For biodegradation studies, these fungal isolates were inoculated on streptomycin
incorporated potato dextrose agar (PDA) medium which comprised 20-micron LDPE film. After
90 days of incubation, gravimetric analysis, light microscopy, Fourier- Transform Infrared
Spectroscopy (FTIR) and Scanning Electron Microscopy (SEM) were conducted to determine the
potent of these fungal isolates in degrading LDPE. These fungal isolates were identified by
sequencing internal transcribed spacer region (ITS). Multiple alignments of partial sequences
were performed by CLUSTAL W and the phylogeny was analyzed using MEGA 6.0 software.
According to the one-way Analysis of Variance, the mean values of weight loss of control and
Aspergillus niger isolate PS3. (P=0.000), control and Fusarium sp. isolate PS3 (P=0.031) and
control and Penicillium sp. isolate PS2 (P=0.010) were significantly different. Scanning electron
microscope images and light microscopic observations showed the presence of fungal colonization
and surface erosion, cracks, folding and firm fungal attachment. The FTIR spectroscopy images of
Fusarium sp. isolate PS3 treated LDPE films showed the early stage of degradation by initiating
bonds such as carboxylic bonds and aldehyde bonds. The fungal isolates were identified as
Fusarium sp. isolate PS3, Penicillium sp isolate PS2 and Aspergillus niger isolate PS3 by
analyzing the ITS region sequencing. Therefore, it can be concluded that the fungal species,
Fusarium sp., Aspergillus sp. and Penicillium sp. are capable of colonizing on LDPE films and
has the potential to be developed into an inoculum for expedited LDPE degradation.
