Please use this identifier to cite or link to this item: http://archive.cmb.ac.lk:8080/xmlui/handle/70130/5454
Title: The development of a goodness-of-fit test for high level binary multilevel models.
Authors: Fernando, G.
Sooriyarachchi, M.R.
Keywords: Goodness-of-fit test; Limited-information goodness- of-fit testing; High level models; Type I error; power; Simulation
Issue Date: 2020
Publisher: Taylor and Francis
Citation: Gayara Fernando, Roshini Sooriyarachchi (2020). The development of a goodness-of-fit test for high level binary multilevel models. Communications in Statistics-Simulation and Computation. Published Online DOI: 10.1080/03610918.2019.1700275
Abstract: Before making inferences about a population using a fitted model, it is necessary to determine whether the fitted model describes the data well. A poorly fitted model may lead to biased and invalid conclusions, resulting in incorrect inferences. Recent studies show the necessity of goodness-of-fit tests for high level binary multilevel models. The focus here was to develop a goodness-of-fit test to use in the model adequacy testing of high level binary multilevel models and to examine, whether the type I error and power hold for the newly developed goodness-of-fit test considering a three-level random intercept model.
URI: http://archive.cmb.ac.lk:8080/xmlui/handle/70130/5454
Appears in Collections:Department of Statistics

Files in This Item:
File Description SizeFormat 
Published.pdf1.69 MBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.